Abstract
Key Words
Electromagnetic Compatibility, Prediction, Modeling, ICEM, Integrated Circuit (IC)
Abstract
In collaboration with the ElectroMagnetic Compatibility (EMC) for IC Working Group at the UTE, Freescale Semiconductor develops a methodology to predict electromagnetic emission of ICs. Issued for this activity, a standard model proposal called ICEM (Integrated Circuit Emission Model) was submitted to the IEC. A complete description of this ICEM approach will be presented. Two approaches are proposed for building the ICEM Model. The first one, more dedicated to the IC suppliers, is based on simulation tools, allowing them to access to the model before having the first silicon and therefore to optimize EMC at the IC level. The second approach, based on measurement methods, allows IC suppliers or IC customer to build the model. The measurements are performed by using a Network Analyzer to determine the different parameters of the model. Validation of this approach has been done based on comparison between measurement results and simulation. The measurements were performed using the EMC for IC emission measurement methods IEC61967.