Abstract
Keywords:
Reliability, power electronics, power module, ageing, failure mode.
Abstract:
HEV is one the harshest application for standard technology of power devices and converters. High temperature capability and passive / active thermal cycle ageing must be evaluated. Authors present three complementary approaches to extract data on ageing and failure modes for a 600V/200A IGBT module and a 75V/350A Mosfet module: an opposition method between two cycled PWM inverter legs, a low voltage / cycled DC current test bench and finally a thermal shock test unit. First results give out compatible features but future accelerated ageing tests are expected to extract predictive models.